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. Ed(S): Bauer, Gunther; Richter, Wolfgang - Optical Characterization of Epitaxial Semiconductor Layers - 9783642796807 - V9783642796807
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Optical Characterization of Epitaxial Semiconductor Layers

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Description for Optical Characterization of Epitaxial Semiconductor Layers Paperback. Editor(s): Bauer, Gunther; Richter, Wolfgang. Num Pages: 445 pages, biography. BIC Classification: TGM; TJFD; TTB. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 23. Weight in Grams: 679.
The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decade. In particular, the dramatic improvement of the structural quality of semiconductor epilayers and heterostructures results to a great deal from the level of sophistication achieved with such analysis techniques. First of all, optical techniques are nondestructive and their sensitivity has been improved to such an extent that nowadays the epilayer analysis can be performed on layers with thicknesses on the atomic scale. Furthermore, the spatial and temporal resolution have been pushed to such limits that real ... Read more

Product Details

Format
Paperback
Publication date
2011
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
445
Condition
New
Number of Pages
429
Place of Publication
Berlin, Germany
ISBN
9783642796807
SKU
V9783642796807
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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