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Lock-in Thermography
Breitenstein, Otwin; Warta, Wilhelm; Langenkamp, Martin
€ 128.87
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Description for Lock-in Thermography
Hardback. Lock-in Thermography focuses on this sensitive infrared measurement system that offers a more effective analytical capability. Though mainly covering applications in electronic materials and devices, readers will also find treatment of nondestructive evaluation. Series: Springer Series in Advanced Microelectronics. Num Pages: 268 pages, 56 black & white illustrations, 33 colour illustrations, biography. BIC Classification: TBC; TGMT; TTB. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 20. Weight in Grams: 616.
In the last 7 years, the ?rst edition of “Lock-in Thermography” has established as a reference book for all users of this technique for investigating electronic devices, especially solar cells. At this time, a vital further development of lock-in therm- raphy could be observed. Not only the experimental technique was improved by applying new and better infrared cameras, solid immersion lenses, and novel t- ing strategies, but also completely new application ?elds of lock-in thermography were established by implying irradiation of light during the measurements. The two groups of new techniques are different kinds of Illuminated Lock-In Thermography (ILIT) and ... Read more
In the last 7 years, the ?rst edition of “Lock-in Thermography” has established as a reference book for all users of this technique for investigating electronic devices, especially solar cells. At this time, a vital further development of lock-in therm- raphy could be observed. Not only the experimental technique was improved by applying new and better infrared cameras, solid immersion lenses, and novel t- ing strategies, but also completely new application ?elds of lock-in thermography were established by implying irradiation of light during the measurements. The two groups of new techniques are different kinds of Illuminated Lock-In Thermography (ILIT) and ... Read more
Product Details
Format
Hardback
Publication date
2010
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
268
Condition
New
Series
Springer Series in Advanced Microelectronics
Number of Pages
258
Place of Publication
Berlin, Germany
ISBN
9783642024160
SKU
V9783642024160
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
About Breitenstein, Otwin; Warta, Wilhelm; Langenkamp, Martin
Otwin Breitenstein studied physics at Leipzig university and graduated there in 1980. After dealing with spatially resolved capacitance spectroscopy of point defects (Scanning-DLTS) at the Institute of Solid State Physics and Electron Microscopy in Halle until 1992, he is a scientific staff member at Max Planck Institute of Microstructure Physics, Halle. His main interest field is electronic device and materials ... Read more
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