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Li, Ting; Liu, Ziv. Ed(S): Liu, Zhiwei - Outlook and Challenges of Nano Devices, Sensors, and Mems - 9783319508221 - V9783319508221
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Outlook and Challenges of Nano Devices, Sensors, and Mems

€ 190.56
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Description for Outlook and Challenges of Nano Devices, Sensors, and Mems Hardback. Editor(s): Liu, Zhiwei. Num Pages: 521 pages, 95 black & white illustrations, 272 colour illustrations, 25 colour tables, biography. BIC Classification: TBN; TDPB; TJFC. Category: (P) Professional & Vocational. Dimension: 235 x 155. Weight in Grams: 967.

This book provides readers with an overview of the design, fabrication, simulation, and reliability of nanoscale semiconductor devices, MEMS, and sensors, as they serve for realizing the next-generation internet of things. The authors focus on how the nanoscale structures interact with the electrical and/or optical performance, how to find optimal solutions to achieve the best outcome, how these apparatus can be designed via models and simulations, how to improve reliability, and what are the possible challenges and roadblocks moving forward.

Product Details

Format
Hardback
Publication date
2017
Publisher
Springer International Publishing AG Switzerland
Number of pages
521
Condition
New
Number of Pages
521
Place of Publication
Cham, Switzerland
ISBN
9783319508221
SKU
V9783319508221
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

About Li, Ting; Liu, Ziv. Ed(S): Liu, Zhiwei
Juin J. Liou received the B.S. (honors), M.S., and Ph.D. degrees in electrical engineering from the University of Florida, Gainesville, in 1982, 1983, and 1987, respectively. In 1987, he joined the Department of Electrical and Computer Engineering at the University of Central Florida (UCF), Orlando, Florida where he is now the Pegasus Distinguished Professor, Lockheed Martin St. Laurent Professor, and ... Read more

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