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Physical Measurement and Analysis of Thin Films
E. M. . Ed(S): Murt
€ 66.04
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Description for Physical Measurement and Analysis of Thin Films
Paperback. Editor(s): Murt, E. M. Series: Progress in Analytical Chemistry. Num Pages: 194 pages, 99 black & white illustrations, biography. BIC Classification: PNR. Category: (P) Professional & Vocational. Dimension: 229 x 152 x 11. Weight in Grams: 311.
Product Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
194
Condition
New
Series
Progress in Analytical Chemistry
Number of Pages
194
Place of Publication
New York, United States
ISBN
9781489959126
SKU
V9781489959126
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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