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. Ed(S): Barrett, Charles S.; Gilfrich, John V.; Jenkins, Ron; Russ, John C.; Richardson, Jacob W.; Predecki, Paul K. - Advances in X-Ray Analysis - 9781475791129 - V9781475791129
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Advances in X-Ray Analysis

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Description for Advances in X-Ray Analysis Paperback. Editor(s): Barrett, Charles S.; Gilfrich, John V.; Jenkins, Ron; Russ, John C.; Richardson, Jacob W.; Predecki, Paul K. Num Pages: 682 pages, biography. BIC Classification: PH. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 36. Weight in Grams: 1326.
The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was "High Brilliance Sources/Applications," and dealt exclusively with synchrotron radiation, a topic which has made a ... Read more

Product Details

Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
682
Condition
New
Number of Pages
682
Place of Publication
New York, NY, United States
ISBN
9781475791129
SKU
V9781475791129
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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