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B. K. Tanner - Characterization of Crystal Growth Defects by X-Ray Methods - 9781475711288 - V9781475711288
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Characterization of Crystal Growth Defects by X-Ray Methods

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Description for Characterization of Crystal Growth Defects by X-Ray Methods Paperback. Series: NATO Science Series B. Num Pages: 615 pages, 556 black & white illustrations, biography. BIC Classification: PHFC. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 31. Weight in Grams: 1156.
This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties ... Read more

Product Details

Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
615
Condition
New
Series
NATO Science Series B
Number of Pages
589
Place of Publication
New York, NY, United States
ISBN
9781475711288
SKU
V9781475711288
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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