Stock image for illustration purposes only - book cover, edition or condition may vary.
Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces
Sascha Sadewasser (Ed.)
€ 122.51
FREE Delivery in Ireland
Description for Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces
Paperback. This volume presents a concise introduction to Kelvin probe force microscopy. The text discusses potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. Editor(s): Sadewasser, Sascha; Glatzel, Thilo. Series: Springer Series in Surface Sciences. Num Pages: 348 pages, biography. BIC Classification: PHH; TGM; TGMB. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 18. Weight in Grams: 527.
Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
Product Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Condition
New
Series
Springer Series in Surface Sciences
Number of Pages
334
Place of Publication
Berlin, Germany
ISBN
9783642271137
SKU
V9783642271137
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces