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Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems
Purusho Chakraborty
€ 137.22
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Description for Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems
Hardcover. Editor(s): Chakraborty, Purushottam. Num Pages: 445 pages, b/w illus. BIC Classification: PHFC. Category: (P) Professional & Vocational. Dimension: 189 x 262 x 33. Weight in Grams: 1126.
Product Details
Format
Hardback
Publication date
2002
Publisher
Nova Science Publishers Inc United States
Number of pages
445
Condition
New
Number of Pages
445
Place of Publication
New York, United States
ISBN
9781590335383
SKU
V9781590335383
Shipping Time
Usually ships in 5 to 9 working days
Ref
99-1
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