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Point and Extended Defects in Semiconductors
Giorgio . Ed(S): Benedek
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Description for Point and Extended Defects in Semiconductors
Paperback. Editor(s): Benedek, Giorgio. Series: NATO Science Series B. Num Pages: 297 pages, black & white illustrations. BIC Classification: PHFC; PNFS. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 15. Weight in Grams: 574.
Product Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
297
Condition
New
Series
NATO Science Series B
ISBN
9781468457117
SKU
V9781468457117
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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