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Scanning Electron Microscopy
Ludwig Reimer
€ 355.71
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Description for Scanning Electron Microscopy
Paperback. Series: Springer Series in Optical Sciences. Num Pages: 543 pages, biography. BIC Classification: PDND; PHFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 27. Weight in Grams: 825.
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Product Details
Format
Paperback
Publication date
2010
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
543
Condition
New
Series
Springer Series in Optical Sciences
Number of Pages
529
Place of Publication
Berlin, Germany
ISBN
9783642083723
SKU
V9783642083723
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Scanning Electron Microscopy
"...this book is both linguistically and scientifically outstanding. It is an inspiring book for beginners and experienced SEM operators alike. The list of references is especially useful. This volume makes an outstanding contribution to the deeper understanding of the SEM." T Mulvey, Measurement Science and Technology. 11, No12, December 2000