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Secondary Ion Mass Spectrometry SIMS
. Ed(S): Benninghoven, A.; Evans, C. A.; Powell, R. A.; Shimizu, R.; Storms, H. A.
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Description for Secondary Ion Mass Spectrometry SIMS
Paperback. Editor(s): Benninghoven, A.; Evans, C. A.; Powell, R. A.; Shimizu, R.; Storms, H. A. Series: Springer Series in Chemical Physics. Num Pages: 314 pages, biography. BIC Classification: PH. Category: (P) Professional & Vocational. Dimension: 229 x 152 x 17. Weight in Grams: 465.
Product Details
Format
Paperback
Publication date
2011
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
314
Condition
New
Series
Springer Series in Chemical Physics
Number of Pages
300
Place of Publication
Berlin, Germany
ISBN
9783642618734
SKU
V9783642618734
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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