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Site Characterization and Aggregation of Implanted Atoms in Materials
. Ed(S): Perez, A.; Coussement, R.
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Description for Site Characterization and Aggregation of Implanted Atoms in Materials
Paperback. Editor(s): Perez, A.; Coussement, R. Series: NATO Science Series B. Num Pages: 520 pages, biography. BIC Classification: PHFC. Category: (G) General (US: Trade). Dimension: 244 x 170 x 27. Weight in Grams: 913.
Explosive developments in microelectronics, interest in nuclear metallurgy, and widespread applications in surface science have all produced many advances in the field of ion implantation. The research activity has become so intensive and so broad that the field has become divided into many specialized subfields. An Advanced Study Institute, covering the basic and common phenomena of aggregation, seems opportune for initiating interested scientists and engineers into these various active subfields since aggregation usually follows ion implantation. As a consequence, Drs. Perez, Coussement, Marest, Cachard and I submitted such a pro posal to the Scientific Affairs Division of NATO, the approval ... Read more
Explosive developments in microelectronics, interest in nuclear metallurgy, and widespread applications in surface science have all produced many advances in the field of ion implantation. The research activity has become so intensive and so broad that the field has become divided into many specialized subfields. An Advanced Study Institute, covering the basic and common phenomena of aggregation, seems opportune for initiating interested scientists and engineers into these various active subfields since aggregation usually follows ion implantation. As a consequence, Drs. Perez, Coussement, Marest, Cachard and I submitted such a pro posal to the Scientific Affairs Division of NATO, the approval ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
520
Condition
New
Series
NATO Science Series B
Number of Pages
520
Place of Publication
New York, NY, United States
ISBN
9781468410174
SKU
V9781468410174
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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