Stock image for illustration purposes only - book cover, edition or condition may vary.
Transmission Electron Microscopy of Semiconductor Nanostructures
Andreas Rosenauer
€ 63.62
FREE Delivery in Ireland
Description for Transmission Electron Microscopy of Semiconductor Nanostructures
Paperback. Series: Springer Tracts in Modern Physics. Num Pages: 253 pages, 186 black & white illustrations, 47 colour illustrations, biography. BIC Classification: PDDM; PHF; PNFS; TGMT. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 14. Weight in Grams: 397.
This book provides tools well suited for the quantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductor nanostructures with a spatial resolution at near atomic scales. The book focuses on new methods including strain state analysis as well as evaluation of the composition via the lattice fringe analysis (CELFA) technique. The basics of these procedures as well as their advantages, drawbacks and sources of error are all discussed. The techniques are applied to quantum wells and dots in order to give insight into kinetic growth effects such as segregation ... Read more
This book provides tools well suited for the quantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductor nanostructures with a spatial resolution at near atomic scales. The book focuses on new methods including strain state analysis as well as evaluation of the composition via the lattice fringe analysis (CELFA) technique. The basics of these procedures as well as their advantages, drawbacks and sources of error are all discussed. The techniques are applied to quantum wells and dots in order to give insight into kinetic growth effects such as segregation ... Read more
Product Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
253
Condition
New
Series
Springer Tracts in Modern Physics
Number of Pages
241
Place of Publication
Berlin, Germany
ISBN
9783662146187
SKU
V9783662146187
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Transmission Electron Microscopy of Semiconductor Nanostructures