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Spaeth, Johann-Martin; Overhof, Harald (University Of Paderborn, Germany) - Point Defects in Semiconductors and Insulators - 9783642627224 - V9783642627224
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Point Defects in Semiconductors and Insulators

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Description for Point Defects in Semiconductors and Insulators Paperback. Series: Springer Series in Materials Science. Num Pages: 503 pages, biography. BIC Classification: TGM. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 25. Weight in Grams: 705.
The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap­ peared about 10 years ago. Since then a very active development has oc­ curred both with respect to the experimental methods and the theoretical interpretation of the experimental results. It would therefore not have been sufficient to simply publish a second edition of the precedent book with cor­ rections and a few additions. Furthermore the application of the multiple magnetic resonance methods has more and more shifted towards materials science and represents one of the important methods of materials ... Read more

Product Details

Format
Paperback
Publication date
2012
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
503
Condition
New
Series
Springer Series in Materials Science
Number of Pages
492
Place of Publication
Berlin, Germany
ISBN
9783642627224
SKU
V9783642627224
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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