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Krause-Rehberg, Reinhard; Leipner, Hartmut S. - Positron Annihilation in Semiconductors - 9783540643715 - V9783540643715
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Positron Annihilation in Semiconductors

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Description for Positron Annihilation in Semiconductors Hardback. Reports on the investigations of lattice imperfections in semiconductors by means of positron annihilation. This book reviews positron techniques, and describes the application of these techniques to various kinds of defects, such as vacancies, impurity vacancy complexes and dislocations. Series: Springer Series in Solid-State Sciences. Num Pages: 398 pages, 121 black & white illustrations, 20 black & white tables, biography. BIC Classification: TJFD5. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 22. Weight in Grams: 735.
The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. A comprehensive review is given of the different positron techniques, whose application to various kinds of defects, e.g. vacancies, impurity-vacancy complexes and dislocations, is described. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods. The most prominent results obtained with positrons in practically all important semiconductors are reviewed. A special chapter of the book deals with positron annihilation as a promising tool for many technological purposes. The theoretical background ... Read more

Product Details

Format
Hardback
Publication date
1999
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
398
Condition
New
Series
Springer Series in Solid-State Sciences
Number of Pages
383
Place of Publication
Berlin, Germany
ISBN
9783540643715
SKU
V9783540643715
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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