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32%OFFKaschieva, S.; Ndmitriev, S. - Radiation Defects in Ion Implanted and/or High-Energy Irradiated MOS Structures - 9781608761883 - V9781608761883
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Radiation Defects in Ion Implanted and/or High-Energy Irradiated MOS Structures

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Description for Radiation Defects in Ion Implanted and/or High-Energy Irradiated MOS Structures Hardcover. Num Pages: 196 pages, tables & charts. BIC Classification: THR. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 240 x 162 x 17. Weight in Grams: 434.

Product Details

Format
Hardback
Publication date
2010
Publisher
Nova Science Publishers Inc United States
Number of pages
196
Condition
New
Number of Pages
196
Place of Publication
New York, United States
ISBN
9781608761883
SKU
V9781608761883
Shipping Time
Usually ships in 5 to 9 working days
Ref
99-1

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