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. Ed(S): Velazco, Raoul; Fouillat, Pascal; Reis, Ricardo - Radiation Effects on Embedded Systems - 9781402056451 - V9781402056451
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Radiation Effects on Embedded Systems

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Description for Radiation Effects on Embedded Systems Hardback. Aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in modern application devoted to operate in space, but also in the atmosphere at high altitude or at ground level. This book provides IC engineers with information regarding outside influences on their designs. Editor(s): Velazco, Raoul; Fouillat, Pascal; Reis, Ricardo. Num Pages: 277 pages, biography. BIC Classification: PNRL; TJFC; URY. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 17. Weight in Grams: 1260.

Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005.

This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs ... Read more

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Product Details

Format
Hardback
Publication date
2007
Publisher
Springer-Verlag New York Inc. United States
Number of pages
277
Condition
New
Number of Pages
269
Place of Publication
New York, NY, United States
ISBN
9781402056451
SKU
V9781402056451
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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