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Liu, Johan; Salmela, Olli; Sarkka, Jussi; Morris, James E.; Tegehall, Per-Erik; Andersson, Cristina - Reliability of Microtechnology: Interconnects, Devices and Systems - 9781489982117 - V9781489982117
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Reliability of Microtechnology: Interconnects, Devices and Systems

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Description for Reliability of Microtechnology: Interconnects, Devices and Systems paperback. This text discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. It covers many topics, and it addresses specific failure modes in solder and conductive adhesives at great length. Num Pages: 217 pages, 50 black & white tables, biography. BIC Classification: TDPB; TGPR; TJF; TJFD. Category: (G) General (US: Trade). Dimension: 235 x 155 x 12. Weight in Grams: 343.

Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general failure mechanisms. Specific failure modes in solder and conductive adhesives are discussed at great length. Coverage of accelerated testing, component and system level reliability, and reliability design for manufacturability are also described in detail.

The book also includes exercises and detailed solutions at the end of each chapter.

Product Details

Format
Paperback
Publication date
2014
Publisher
Springer United States
Number of pages
217
Condition
New
Number of Pages
204
Place of Publication
New York, United States
ISBN
9781489982117
SKU
V9781489982117
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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