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. Ed(S): Prutton, Martin; El Gomati, Mohamed M. - Scanning Auger Electron Microscopy - 9780470866771 - V9780470866771
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Scanning Auger Electron Microscopy

€ 345.59
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Description for Scanning Auger Electron Microscopy This eagerly-awaited volume has been edited by two academic researchers with extensive and reputable experience in this field. Editor(s): Prutton, Martin; El Gomati, Mohamed M. Num Pages: 384 pages, Illustrations (some col.). BIC Classification: TG. Category: (P) Professional & Vocational. Dimension: 236 x 180 x 24. Weight in Grams: 844.
This eagerly-awaited volume has been edited by two academic researchers with extensive and reputable experience in this field. Emphasis is given to the underlying science of the method of Auger microscopy, and its instrumental realization, the visualization and interpretation of the data in the sets of the images that form the output of the measurements and the methods used to quantify the images. Imaging artefacts in Auger microscopy and methods to correct them are also detailed. The authors describe the technique of Multi-Spectral Auger Microscopy (MULSAM) and demonstrate its advantages in mapping complex multi-component surfaces. The book concludes with an ... Read more

Product Details

Publication date
2006
Publisher
John Wiley and Sons Ltd United Kingdom
Number of pages
384
Condition
New
Number of Pages
392
Format
Hardback
Place of Publication
New York, United States
ISBN
9780470866771
SKU
V9780470866771
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

About . Ed(S): Prutton, Martin; El Gomati, Mohamed M.
Martin Prutton is the editor of Scanning Auger Electron Microscopy, published by Wiley. Mohamed M. El Gomati is the editor of Scanning Auger Electron Microscopy, published by Wiley.

Reviews for Scanning Auger Electron Microscopy
"…this book fills a key gap for researchers and graduate students." (Journal of the American Chemical Society, December 27, 2006)

Goodreads reviews for Scanning Auger Electron Microscopy


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