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Joseph Goldstein - Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists - 9781461332756 - V9781461332756
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists

€ 122.76
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Description for Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists Paperback. Num Pages: 673 pages, 322 black & white illustrations, biography. BIC Classification: PSC; RB; TGMT. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 35. Weight in Grams: 1044.
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives ... Read more

Product Details

Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc.
Condition
New
Number of Pages
673
Place of Publication
New York, NY, United States
ISBN
9781461332756
SKU
V9781461332756
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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