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. Ed(S): Zhou, Weilie; Wang, Zhong Lin - Scanning Microscopy for Nanotechnology - 9780387333250 - V9780387333250
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Scanning Microscopy for Nanotechnology

€ 272.59
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Description for Scanning Microscopy for Nanotechnology Hardback. Presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. This book includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and covers in-situ nanomanipulation of materials. It is of interest to nanomaterials researchers, and to SEM development specialists. Editor(s): Zhou, Weilie; Wang, Zhong Lin. Num Pages: 522 pages, 399 black & white illustrations, biography. BIC Classification: TBN. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 30. Weight in Grams: 945.

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM ... Read more

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Product Details

Format
Hardback
Publication date
2006
Publisher
Springer-Verlag New York Inc. United States
Number of pages
522
Condition
New
Number of Pages
522
Place of Publication
New York, NY, United States
ISBN
9780387333250
SKU
V9780387333250
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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