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Foster, Adam; Hofer, Werner - Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - 9781441923066 - V9781441923066
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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents

€ 181.64
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Description for Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents paperback. Series: Nanoscience and Technology. Num Pages: 296 pages, biography. BIC Classification: PDND. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 16. Weight in Grams: 456.

Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today’s simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will ... Read more

 

Key Features

  • Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy
  • Provides a framework for linking scanning probe theory and simulations with experimental data
  • Written in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations
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Product Details

Format
Paperback
Publication date
2010
Publisher
Springer United States
Number of pages
296
Condition
New
Series
Nanoscience and Technology
Number of Pages
282
Place of Publication
New York, NY, United States
ISBN
9781441923066
SKU
V9781441923066
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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