Scanning Probe Microscopy, Characterization, Nanofabrication and Device Application of Functional Materials
. Ed(S): Vilarinho, Paula M. (University Of Aveiro); Rosenwaks, Yossi; Kingon, Angus
As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as ... Read more
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