Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Gerd Kaupp
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Description for Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Hardback. Makes a distinction that is made between nano- and micro-mechanical testing for physical reasons. This monograph describes the basics and applications of the supermicroscopies AFM and SNOM. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes special features. Series: Nanoscience and Technology. Num Pages: 304 pages, 7 black & white tables, biography. BIC Classification: PDND. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 19. Weight in Grams: 609.
Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in ... Read more
Show LessProduct Details
Format
Hardback
Publication date
2006
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
304
Condition
New
Series
Nanoscience and Technology
Number of Pages
292
Place of Publication
Berlin, Germany
ISBN
9783540284055
SKU
V9783540284055
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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