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Atomic Force Microscopy/scanning Tunneling Microscopy
. Ed(S): Bray, M. T.; Cohen, S.H.; Lightbody, Marcia L.
€ 203.15
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Description for Atomic Force Microscopy/scanning Tunneling Microscopy
Hardback. Editor(s): Bray, M. T.; Cohen, S.H.; Lightbody, Marcia L. Num Pages: 454 pages, biography. BIC Classification: PDND; TGM. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 26. Weight in Grams: 1830.
The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists from a number of diverse fields could interact with one another and exchange ideas. The various topics inc1uded application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments inc1uding new probe microscopies and frontiers in this exciting area. The meeting's format was designed to encourage communication ... Read more
The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists from a number of diverse fields could interact with one another and exchange ideas. The various topics inc1uded application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments inc1uding new probe microscopies and frontiers in this exciting area. The meeting's format was designed to encourage communication ... Read more
Product Details
Format
Hardback
Publication date
1995
Publisher
Springer Science+Business Media United States
Number of pages
454
Condition
New
Number of Pages
454
Place of Publication
, United States
ISBN
9780306448904
SKU
V9780306448904
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Atomic Force Microscopy/scanning Tunneling Microscopy
`The editors have done a fine job assembling a variety of contributions of varied style, topics, and current relevance into a coherent whole. The quality of the images, typesetting are all excellent and the book is organized in a thoughtful way.' Scanning