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Shindo, Daisuke; Kenji, Hiraga - High-resolution Electron Microscopy for Materials Science - 9784431702344 - V9784431702344
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High-resolution Electron Microscopy for Materials Science

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Description for High-resolution Electron Microscopy for Materials Science Paperback. An explanation of the theory and practice of high-resolution electron microscopy for materials science. It formulates the imaging process of HREM, examines simulation for interpretation of high-resolution images, and methods for extracting structural information from these observations are shown. Num Pages: 190 pages, biography. BIC Classification: PDND; TGM. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 280 x 210 x 11. Weight in Grams: 620.
High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are ... Read more

Product Details

Format
Paperback
Publication date
1998
Publisher
Springer Verlag, Japan Japan
Number of pages
190
Condition
New
Number of Pages
190
Place of Publication
Tokyo, Japan
ISBN
9784431702344
SKU
V9784431702344
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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