Scanning Electron Microscopy and X-Ray Microanalysis
Nicholas W. M. Ritchie
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Description for Scanning Electron Microscopy and X-Ray Microanalysis
Hardback. Num Pages: 700 pages, 149 black & white illustrations, 397 colour illustrations, 348 colour tables, biography. BIC Classification: PDDM; PNFS; PS; TGMT. Category: (P) Professional & Vocational. Dimension: 279 x 210. .
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners - engineers, technicians, physical and biological scientists, clinicians, and technical managers - will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. ... Read more
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners - engineers, technicians, physical and biological scientists, clinicians, and technical managers - will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. ... Read more
Product Details
Publisher
Springer-Verlag New York Inc.
Format
Hardback
Publication date
2017
Condition
New
Number of Pages
550
Place of Publication
New York, United States
ISBN
9781493966745
SKU
V9781493966745
Shipping Time
Usually ships in 4 to 8 working days
Ref
99-2
About Nicholas W. M. Ritchie
This text is written by a team of authors associated with SEM and X-ray Microanalysis Courses presented as part of the Lehigh University Microscopy Summer School. Several of the authors have participated in this activity for more than 30 years.
Reviews for Scanning Electron Microscopy and X-Ray Microanalysis
Form the reviews of the third edition: There is no other single volume that covers as much theory and practice of SEM or X-ray microanalysis as Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition does. It is clearly written ... well organized. ... This is a reference text that no SEM or EPMA laboratory should be ... Read more