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Advances in Scanning Probe Microscopy
. Ed(S): Sakurai, Tadayoshi; Watanabe, Y.
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Description for Advances in Scanning Probe Microscopy
Paperback. Editor(s): Sakurai, Tadayoshi; Watanabe, Y. Series: Advances in Materials Research. Num Pages: 357 pages, biography. BIC Classification: PDND; PHFC; TJFD5. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 19. Weight in Grams: 551.
There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has ... Read more
There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
357
Condition
New
Series
Advances in Materials Research
Number of Pages
343
Place of Publication
Berlin, Germany
ISBN
9783642630842
SKU
V9783642630842
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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