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Applied Scanning Probe Methods II
. Ed(S): Bhushan, Bharat; Fuchs, Harald
€ 196.84
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Description for Applied Scanning Probe Methods II
Hardback. Examines the physical and technical foundation for progress in applied near-field scanning probe techniques. This volume constitutes a comprehensive overview of SPM applications, that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Editor(s): Bhushan, Bharat; Fuchs, Harald. Series: Nanoscience and Technology. Num Pages: 463 pages, 263 black & white illustrations, 7 colour illustrations, 17 black & white tables. BIC Classification: PDND. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 22. Weight in Grams: 771.
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The ... Read more
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The ... Read more
Product Details
Format
Hardback
Publication date
2005
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
463
Condition
New
Series
Nanoscience and Technology
Number of Pages
420
Place of Publication
Berlin, Germany
ISBN
9783540262428
SKU
V9783540262428
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Applied Scanning Probe Methods II
From the reviews: "The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. … As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for ... Read more