.png){kind=logo}
Stock image for illustration purposes only - book cover, edition or condition may vary.
Helium Ion Microscopy
. Ed(S): Golzhauser, Armin; Hlawacek, Gregor
€ 285.71
FREE Delivery in Ireland
Description for Helium Ion Microscopy
Hardback. Editor(s): Golzhauser, Armin; Hlawacek, Gregor. Series: Nanoscience and Technology. Num Pages: 549 pages, 116 black & white illustrations, 204 colour illustrations, 100 colour tables, biography. BIC Classification: PDND; TBN. Category: (G) General (US: Trade). Dimension: 235 x 155 x 30. Weight in Grams: 985.
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading ... Read more
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading ... Read more
Product Details
Format
Hardback
Publication date
2016
Publisher
Springer International Publishing AG Switzerland
Number of pages
549
Condition
New
Series
Nanoscience and Technology
Number of Pages
526
Place of Publication
Cham, Switzerland
ISBN
9783319419886
SKU
V9783319419886
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Helium Ion Microscopy