Modeling Nanoscale Imaging in Electron Microscopy
. Ed(S): Vogt, Thomas; Dahmen, Wolfgang; Binev, Peter
€ 127.76
FREE Delivery in Ireland
Description for Modeling Nanoscale Imaging in Electron Microscopy
Hardback. This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing. Editor(s): Vogt, Thomas; Dahmen, Wolfgang; Binev, Peter. Series: Nanostructure Science and Technology. Num Pages: 191 pages, 40 black & white tables, biography. BIC Classification: PDND; PNF; PNRP; TBN; TGMT. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 20. Weight in Grams: 455.
Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Product Details
Format
Hardback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
191
Condition
New
Series
Nanostructure Science and Technology
Number of Pages
182
Place of Publication
New York, NY, United States
ISBN
9781461421900
SKU
V9781461421900
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
About . Ed(S): Vogt, Thomas; Dahmen, Wolfgang; Binev, Peter
Thomas Vogt is Director of the NanoCenter Educational Foundation and Distinguished Professor of Chemistry & Biochemistry at the University of South Carolina. Wolfgang Dahmen is a professor at RWTH Aachen. Peter G. Binev is a Professor of Mathematics at the University of South Carolina.
Reviews for Modeling Nanoscale Imaging in Electron Microscopy
From the reviews: “In six chapters, the editors tackle the ambitious challenge of bridging the gap between high-level applied mathematics and experimental electron microscopy. They have met the challenge admirably. … That work is also applicable to the new generation of x-ray free-electron lasers, which have similar prospective applications, and illustrates nicely the importance of applied mathematics in the ... Read more