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Henning Friis Poulsen - Three-Dimensional X-Ray Diffraction Microscopy - 9783540223306 - V9783540223306
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Three-Dimensional X-Ray Diffraction Microscopy

€ 252.58
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Description for Three-Dimensional X-Ray Diffraction Microscopy Hardback. Series: Springer Tracts in Modern Physics. Num Pages: 168 pages, 7 black & white tables, biography. BIC Classification: PDND. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 11. Weight in Grams: 930.

Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing.

The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. ... Read more

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Product Details

Format
Hardback
Publication date
2004
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
168
Condition
New
Series
Springer Tracts in Modern Physics
Number of Pages
156
Place of Publication
Berlin, Germany
ISBN
9783540223306
SKU
V9783540223306
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

Reviews for Three-Dimensional X-Ray Diffraction Microscopy
From the reviews: "The aim of this book is to give a comprehensive account of 3DXRD microscopy, with a focus both on methodology and on applications. … the book may serve to stimulate research in other fields also, such as geophysics, geology, chemistry, and pharmaceutical science. In short, the book is a very sound and ... Read more

Goodreads reviews for Three-Dimensional X-Ray Diffraction Microscopy


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