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Secondary Ion Mass Spectrometry
Paul Van Der Heide
€ 144.26
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Description for Secondary Ion Mass Spectrometry
This book serves as a practical reference for anyone involved in any form of Secondary Ion Mass Spectrometry (SIMS). This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications. Num Pages: 384 pages, black & white illustrations, black & white tables, figures, graphs. BIC Classification: PNFS. Category: (P) Professional & Vocational. Dimension: 243 x 160 x 24. Weight in Grams: 664.
Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)
• Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations
• Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission
• Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)
• Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring ... Read more
Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)
• Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations
• Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission
• Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)
• Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring ... Read more
Product Details
Publication date
2014
Publisher
John Wiley & Sons Inc United States
Number of pages
384
Condition
New
Number of Pages
384
Format
Hardback
Place of Publication
New York, United States
ISBN
9781118480489
SKU
V9781118480489
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-50
About Paul Van Der Heide
Paul van der Heide is a recognized leader in surface analysis with emphasis on the application of Secondary Ion Mass Spectrometry (SIMS). This interest started during his PhD (completed in 1992 at the University of Auckland) which involved the design and construction of a magnetic sector SIMS instrument. Paul has since been heavily involved in the application and development of ... Read more
Reviews for Secondary Ion Mass Spectrometry
“It is well worth owning if you want to learn about this exciting surface science technique for studying materials.” (IEEE Electrical Engineering magazine, 1 May 2015) “The entire book, and especially the second part, is a good reference work for users of D-SIMS and S-SIMS and for those working in other methods in analytical chemistry and the applied ... Read more