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Srivastava, Ashish; Sylvester, Dennis; Blaauw, David - Statistical Analysis and Optimization for VLSI: Timing and Power - 9781441938275 - V9781441938275
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Statistical Analysis and Optimization for VLSI: Timing and Power

€ 194.05
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Description for Statistical Analysis and Optimization for VLSI: Timing and Power Paperback. Series: Integrated Circuits and Systems. Num Pages: 280 pages, 105 black & white illustrations, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 15. Weight in Grams: 413.

Statistical Analysis and Optimization For VLSI: Timing and Power is a state-of-the-art book on the newly emerging field of statistical computer-aided design (CAD) tools. The very latest research in statistical timing and power analysis techniques is included, along with efforts to incorporate parametric yield as the key objective function during the design process. Included is the necessary mathematical background on techniques which find widespread use in current analysis and optimization. The emphasis is on algorithms, modeling approaches for process variability, and statistical techniques that are the cornerstone of the probabilistic CAD movement. The authors also describe recent optimization approaches to ... Read more

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Product Details

Format
Paperback
Publication date
2010
Publisher
Springer-Verlag New York Inc. United States
Number of pages
280
Condition
New
Series
Integrated Circuits and Systems
Number of Pages
280
Place of Publication
New York, NY, United States
ISBN
9781441938275
SKU
V9781441938275
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

About Srivastava, Ashish; Sylvester, Dennis; Blaauw, David
Ashish Srivastava received the B.Tech. degree in electrical engineering from the Indian Institute of Technology, Kanpur in 2001 and the M.S. degree in electrical engineering from the University of Michigan, Ann Arbor in 2003. He is currently pursuing the Ph.D. degree at the University of Michigan, Ann Arbor. In summe r 2003 he was with the Technology CAD Division, Intel ... Read more

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