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Statistical Regression with Measurement Error: Kendall´s Library of Statistics 6
Chi-Lun Cheng
€ 90.43
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Description for Statistical Regression with Measurement Error: Kendall´s Library of Statistics 6
Hardcover. Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. Num Pages: 262 pages, black & white illustrations. BIC Classification: PB. Category: (P) Professional & Vocational. Dimension: 236 x 166 x 23. Weight in Grams: 554.
Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.
Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.
Product Details
Format
Hardback
Publication date
1999
Publisher
John Wiley & Sons Inc United Kingdom
Number of pages
262
Condition
New
Number of Pages
282
Place of Publication
New York, United States
ISBN
9780470711064
SKU
V9780470711064
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-50
About Chi-Lun Cheng
Chi-Lun Cheng and John W. Van Ness are the authors of Statistical Regression with Measurement Error: Kendall's Library of Statistics 6, published by Wiley.
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