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Strain Effect in Semiconductors
Sun, Yongke; Thompson, Scott E.; Nishida, Toshikazu
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Description for Strain Effect in Semiconductors
Paperback. This text presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Num Pages: 362 pages, biography. BIC Classification: PHF; PNFS; TJF; TJFD. Category: (G) General (US: Trade). Dimension: 235 x 155 x 19. Weight in Grams: 557.
Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.
Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.
Product Details
Format
Paperback
Publication date
2014
Publisher
Springer-Verlag New York Inc. United States
Number of pages
362
Condition
New
Number of Pages
350
Place of Publication
New York, United States
ISBN
9781489983152
SKU
V9781489983152
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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