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Ugo . Ed(S): Valdre - Surface and Interface Characterization by Electron Optical Methods - 9781461595397 - V9781461595397
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Surface and Interface Characterization by Electron Optical Methods

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Description for Surface and Interface Characterization by Electron Optical Methods Paperback. Editor(s): Valdre, Ugo. Series: NATO ASI Subseries B. Num Pages: 319 pages, 156 black & white illustrations, 3 colour illustrations. BIC Classification: PHFC. Category: (G) General (US: Trade). Dimension: 244 x 170 x 17. Weight in Grams: 574.
The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and difficult process. In the past few years remarkable progress has been achieved, including the development of new techniques of scanning transmission and reflection imaging as well as low energy microscopy, all carried out in greatly improved vacuum conditions. Most astonishing of all has been the advent of the scanning tunneling electron microscope providing ... Read more

Product Details

Format
Paperback
Publication date
1989
Publisher
Springer-Verlag New York Inc. United States
Number of pages
319
Condition
New
Series
NATO ASI Subseries B
Number of Pages
319
Place of Publication
New York, NY, United States
ISBN
9781461595397
SKU
V9781461595397
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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