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Surface Infrared and Raman Spectroscopy
W. Suetaka
€ 119.56
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Description for Surface Infrared and Raman Spectroscopy
Paperback. Series: Methods of Surface Characterization. Num Pages: 284 pages, biography. BIC Classification: PHF; PHFC; PNF; PNFS; PNR. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 15. Weight in Grams: 444.
are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di verse areas of science and technology. We hope ... Read more
are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di verse areas of science and technology. We hope ... Read more
Product Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
284
Condition
New
Series
Methods of Surface Characterization
Number of Pages
270
Place of Publication
New York, United States
ISBN
9781489909442
SKU
V9781489909442
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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