Atomic Force Microscopy/Scanning Tunneling Microscopy 2
. Ed(S): Cohen, S.H.; Lightbody, Marcia L.
€ 201.80
FREE Delivery in Ireland
Description for Atomic Force Microscopy/Scanning Tunneling Microscopy 2
hardcover. Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994 Editor(s): Cohen, S.H.; Lightbody, Marcia L. Num Pages: 250 pages, biography. BIC Classification: PDND; TBC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 254 x 178 x 16. Weight in Grams: 1610.
This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art ... Read more
This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art ... Read more
Product Details
Format
Hardback
Publication date
1997
Publisher
Kluwer Boston Incorporated United States
Number of pages
250
Condition
New
Number of Pages
250
Place of Publication
, United States
ISBN
9780306455964
SKU
V9780306455964
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Atomic Force Microscopy/Scanning Tunneling Microscopy 2