×


 x 

Shopping cart
Kipp Van Schooten - Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance - 9783319033280 - V9783319033280
Stock image for illustration purposes only - book cover, edition or condition may vary.

Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance

€ 129.92
FREE Delivery in Ireland
Description for Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance Paperback. This book lays the groundwork for further use of Electron Spin Echo Envelop Modulation (ESEEM) and opens the possibility of highly precise chemical fingerprinting. It reveals an astonishingly long memory of spin coherence in semiconductor particles. Series: Springer Theses. Num Pages: 104 pages, biography. BIC Classification: PHQ; PNFS; TBN; TDPB; TJFD5. Category: (G) General (US: Trade). Dimension: 235 x 155 x 6. Weight in Grams: 174.

Colloidal nanocrystals show much promise as an optoelectronics architecture due to facile control over electronic properties afforded by chemical control of size, shape, and heterostructure. Unfortunately, realizing practical devices has been forestalled by the ubiquitous presence of charge "trap" states which compete with band-edge excitons and result in limited device efficiencies. Little is known about the defining characteristics of these traps, making engineered strategies for their removal difficult.

This thesis outlines pulsed optically detected magnetic resonance as a powerful spectroscopy of the chemical and electronic nature of these deleterious states. Counterintuitive for such heavy atom materials, some trap species possess very ... Read more

Show Less

Product Details

Format
Paperback
Publication date
2014
Publisher
Springer International Publishing AG Switzerland
Number of pages
104
Condition
New
Series
Springer Theses
Number of Pages
90
Place of Publication
Cham, Switzerland
ISBN
9783319033280
SKU
V9783319033280
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

About Kipp Van Schooten
Kipp van Schooten Department of Physics and Astronomy University of Utah Salt Lake City, UT, 84112 USA Kipp van Schooten received his Ph.D. in Physics (Condensed Matter focus) from the University of Utah in December 2012. He received the Outstanding Teaching Assistant award each year from 2005 - 2009 for the courses "Intro to ... Read more

Reviews for Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance

Goodreads reviews for Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance


Subscribe to our newsletter

News on special offers, signed editions & more!