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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Joseph Goldstein
€ 137.67
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Description for Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Paperback. An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Num Pages: 708 pages, biography. BIC Classification: PS; TBN; TGM; TGMT. Category: (P) Professional & Vocational. Dimension: 182 x 255 x 43. Weight in Grams: 1352.
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through ... Read more
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through ... Read more
Product Details
Publisher
Springer-Verlag New York Inc. United States
Number of pages
708
Format
Paperback
Publication date
2013
Condition
New
Number of Pages
689
Place of Publication
New York, NY, United States
ISBN
9781461349693
SKU
V9781461349693
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
“There is no other single volume that covers as much theory and practice of SEM or X-ray microanalysis as Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition does. It is clearly written ... well organized. ... This is a reference text that no SEM or EPMA laboratory should be without.” (Thomas J. Wilson, Scanning, Vol. 27 (4), July/August, 2005) ... Read more