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Pennycook  Stephen J - Scanning Transmission Electron Microscopy - 9781441971999 - V9781441971999
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Scanning Transmission Electron Microscopy

€ 277.08
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Description for Scanning Transmission Electron Microscopy Hardcover. This book provides a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. Editor(s): Pennycook, Stephen J.; Nellist, Peter D. Num Pages: 762 pages, biography. BIC Classification: PDND; PHFC; PSA; TBN; TGMT; TJFD. Category: (P) Professional & Vocational. Dimension: 256 x 184 x 35. Weight in Grams: 1634.

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed ... Read more

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Product Details

Format
Hardback
Publication date
2011
Publisher
Springer-Verlag New York Inc. United States
Number of pages
550
Condition
New
Number of Pages
762
Place of Publication
New York, NY, United States
ISBN
9781441971999
SKU
V9781441971999
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

About Pennycook Stephen J
Stephen J. Pennycook obtained his B.A. degree in natural sciences from the University of Cambridge, England, in 1975, and his M.A. and Ph.D. degrees in physics from the same institution in 1978. He then continued at the University of Cambridge Cavendish Laboratory in postdoctoral positions until moving to the ORNL Solid State Division in 1982, where he is now the ... Read more

Reviews for Scanning Transmission Electron Microscopy
From the reviews: “To describe in 18 chapters the current status in a wide field, a dazzling list of no less than 44 distinguished authors has been assembled.  Fortunately, the role of the editors has continued well beyond the point of producing their own chapters to ensure that these different contributions are reasonably well integrated with a useful index….The ... Read more

Goodreads reviews for Scanning Transmission Electron Microscopy


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