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. Ed(S): Benedetto, John; Zayed, Ahmed I. - Sampling, Wavelets and Tomography - 9780817643041 - V9780817643041
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Sampling, Wavelets and Tomography

€ 135.00
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Description for Sampling, Wavelets and Tomography Hardback. Sampling, wavelets, and tomography are three areas of contemporary mathematics sharing common roots that lie at the heart of harmonic and Fourier analysis. Aimed at mathematicians, scientists, and engineers working in signal and image processing and medical imaging, this work is accessible to an audience with diverse mathematical backgrounds. Editor(s): Benedetto, John; Zayed, Ahmed I. Series: Applied and Numerical Harmonic Analysis. Num Pages: 344 pages, biography. BIC Classification: PDE; TBJ. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (XV) Technical / Manuals. Dimension: 234 x 156 x 22. Weight in Grams: 698.

Sampling, wavelets, and tomography are three active areas of contemporary mathematics sharing common roots that lie at the heart of harmonic and Fourier analysis. The advent of new techniques in mathematical analysis has strengthened their interdependence and led to some new and interesting results in the field.

This state-of-the-art book not only presents new results in these research areas, but it also demonstrates the role of sampling in both wavelet theory and tomography. Specific topics covered include:

* Robustness of Regular Sampling in Sobolev Algebras * Irregular and Semi-Irregular Weyl-Heisenberg Frames * Adaptive Irregular Sampling in Meshfree ... Read more

Aimed at mathematicians, scientists, and engineers working in signal and image processing and medical imaging, the work is designed to be accessible to an audience with diverse mathematical backgrounds. Although the volume reflects the contributions of renowned mathematicians and engineers, each chapter has an expository introduction written for the non-specialist. One of the key features of the book is an introductory chapter stressing the interdependence of the three main areas covered. A comprehensive index completes the work.

Contributors: J.J. Benedetto, N.K. Bose, P.G. Casazza, Y.C. Eldar, H.G. Feichtinger, A. Faridani, A. Iske, S. Jaffard, A. Katsevich, S. Lertrattanapanich, G. Lauritsch, B. Mair, M. Papadakis, P.P. Vaidyanathan, T. Werther, D.C. Wilson, A.I. Zayed

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Product Details

Format
Hardback
Publication date
2003
Publisher
Birkhauser Boston Inc United States
Number of pages
344
Condition
New
Series
Applied and Numerical Harmonic Analysis
Number of Pages
344
Place of Publication
Secaucus, United States
ISBN
9780817643041
SKU
V9780817643041
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

Reviews for Sampling, Wavelets and Tomography
"The book places emphasis on all three themes it considers. It presents applications with a broad perspective.... The book, containing contributions of some of the renowned scientists in the field, is interesting and informative, and presents an insightful approach towards wavelets, sampling theory, and tomography. To conclude, the book is of immense value to the mathematically inclined researcher whose work ... Read more

Goodreads reviews for Sampling, Wavelets and Tomography


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