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Dalia G. Yablon - Scanning Probe Microscopy¿in Industrial Applications: Nanomechanical Characterization - 9781118288238 - V9781118288238
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Scanning Probe Microscopy¿in Industrial Applications: Nanomechanical Characterization

€ 149.92
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Description for Scanning Probe Microscopy¿in Industrial Applications: Nanomechanical Characterization Hardcover. Covering a diverse range of practical applications and real-world examples, Scanning Probe Microscopy for Industrial Applications examines important and successful applications of SPM in various industries, including food science, personal care industry, and forestry applications. Author D.G. Num Pages: 368 pages, Illustrations. BIC Classification: PDND; TBN. Category: (P) Professional & Vocational. Dimension: 243 x 155 x 24. Weight in Grams: 670.

Describes new state-of-the-science tools and their contribution to industrial R&D

With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others.

Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview ... Read more

The second half of the book describes applications of nanomechanical characterization in industry, including:

  • New formulation development for pharmaceuticals
  • Measurement of critical dimensions and thin dielectric films in the semiconductor industry
  • Effect of humidity and temperature on biomaterials
  • Characterization of polymer blends to guide product formulation in the chemicals sector
  • Unraveling links between food structure and function in the food industry

Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems.

By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy in Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.

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Product Details

Format
Hardback
Publication date
2014
Publisher
John Wiley & Sons Inc United States
Number of pages
368
Condition
New
Number of Pages
368
Place of Publication
New York, United States
ISBN
9781118288238
SKU
V9781118288238
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-1

About Dalia G. Yablon
DALIA G. YABLON, PhD, developed and led a state-of-the-art scanning probe microscopy facility for more than ten years in Corporate Strategic Research, the flagship R&D center of ExxonMobil Corporation. Under her direction, scanning probe microscopy was used to characterize, conduct failure analysis, and probe structure-property relationships across all sectors of the vast petroleum business including areas of polymers, tribology, corrosion, ... Read more

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