.png){kind=logo}
Stock image for illustration purposes only - book cover, edition or condition may vary.
Semiconductor Device Reliability
. Ed(S): Christou, A.; Unger, B.A.
€ 373.95
FREE Delivery in Ireland
Description for Semiconductor Device Reliability
Paperback. Proceedings of the NATO Advanced Research Workshop, Heraklion, Crete, Greece, June 4-9, 1989 Editor(s): Christou, A.; Unger, B.A. Series: NATO Science Series E:. Num Pages: 585 pages, biography. BIC Classification: TBC; THR; TJFD5. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 30. Weight in Grams: 890.
This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their ... Read more
This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their ... Read more
Product Details
Format
Paperback
Publication date
2011
Publisher
Springer Netherlands
Number of pages
585
Condition
New
Series
NATO Science Series E:
Number of Pages
575
Place of Publication
Dordrecht, Netherlands
ISBN
9789401076203
SKU
V9789401076203
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Semiconductor Device Reliability