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Simulation of Transport in Nanodevices
Fran Ois Triozon
€ 184.10
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Description for Simulation of Transport in Nanodevices
Hardback. Linear current-voltage pattern, has been and continues to be the basis for characterizing, evaluating performance, and designing integrated circuits, but is shown not to hold its supremacy as channel lengths are being scaled down. Editor(s): Triozon, Francois; Dollfus, Philippe. Num Pages: 396 pages, black & white illustrations. BIC Classification: TBN. Category: (P) Professional & Vocational. Dimension: 241 x 165 x 27. Weight in Grams: 744.
Linear current-voltage pattern, has been and continues to be the basis for characterizing, evaluating performance, and designing integrated circuits, but is shown not to hold its supremacy as channel lengths are being scaled down. In a nanoscale circuit with reduced dimensionality in one or more of the three Cartesian directions, quantum effects transform the carrier statistics. In the high electric field, the collision free ballistic transform is predicted, while in low electric field the transport remains predominantly scattering-limited. In a micro/nano-circuit, even a low logic voltage of 1 V is above the critical voltage triggering nonohmic behavior that results in ... Read more
Linear current-voltage pattern, has been and continues to be the basis for characterizing, evaluating performance, and designing integrated circuits, but is shown not to hold its supremacy as channel lengths are being scaled down. In a nanoscale circuit with reduced dimensionality in one or more of the three Cartesian directions, quantum effects transform the carrier statistics. In the high electric field, the collision free ballistic transform is predicted, while in low electric field the transport remains predominantly scattering-limited. In a micro/nano-circuit, even a low logic voltage of 1 V is above the critical voltage triggering nonohmic behavior that results in ... Read more
Product Details
Format
Hardback
Publication date
2016
Publisher
ISTE Ltd and John Wiley & Sons Inc United Kingdom
Number of pages
396
Condition
New
Number of Pages
228
Place of Publication
London, United Kingdom
ISBN
9781848215665
SKU
V9781848215665
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-1
About Fran Ois Triozon
François Triozon, Researcher at Laboratoire d'Electronique et de Technologies de l'Information (LETI) of CEA/Grenoble, France. Philippe Dollfus, CNRS Research Director, France.
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