5%OFF
Stock image for illustration purposes only - book cover, edition or condition may vary.
Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry
Carter C. Barry
€ 130.52
€ 124.46
FREE Delivery in Ireland
Description for Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry
Hardback. .
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can ... Read more
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can ... Read more
Product Details
Publisher
Springer International Publishing AG
Format
Hardback
Publication date
2016
Condition
New
Number of Pages
518
Place of Publication
Cham, Switzerland
ISBN
9783319266497
SKU
V9783319266497
Shipping Time
Usually ships in 4 to 8 working days
Ref
99-1
About Carter C. Barry
C. Barry Carter is the Editor-in-Chief of the Journal of Materials Science and a CINT Distinguished Affiliate Scientist. He teaches at UConn. David B. Williams is the Monte Ahuja Endowed Dean's Chair, Executive Dean of The Professional Colleges and Dean of the College of Engineering at The Ohio State University.
Reviews for Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry
I would highly recommend this `companion' volume for researchers and students of the materials and applied sciences; in fact, anybody using transmission electron microscopy in their research will extract many practical ideas ... . Because of the high quality of the photographic images, composite illustrations, and text presentations, I suggest that this book has a place on the shelf of ... Read more