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. Ed(S): Lombardi, Fabrizio; Sami, M. G. - Testing and Diagnosis of VLSI and ULSI - 9789401071345 - V9789401071345
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Testing and Diagnosis of VLSI and ULSI

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Description for Testing and Diagnosis of VLSI and ULSI Paperback. Proceedings of the NATO Advanced Study Institute on Testing and Diagnosis of VLSI and ULSI, Como, Italy, June 22-July 3, 1987 Editor(s): Lombardi, Fabrizio; Sami, M. G. Series: NATO Science Series E:. Num Pages: 544 pages, biography. BIC Classification: THR; UGC; WM. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 27. Weight in Grams: 825.
This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention ... Read more

Product Details

Format
Paperback
Publication date
2011
Publisher
Springer Netherlands
Number of pages
544
Condition
New
Series
NATO Science Series E:
Number of Pages
544
Place of Publication
Dordrecht, Netherlands
ISBN
9789401071345
SKU
V9789401071345
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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