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Testing and Reliable Design of CMOS Circuits
Jha, Niraj K.; Kundu, Sandip
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Description for Testing and Reliable Design of CMOS Circuits
Paperback. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 232 pages, biography. BIC Classification: THR; UGC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 13. Weight in Grams: 385.
In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance ments in this area pose many new problems in the area of testing. Testing has become a very time-consuming process. In order to ease the burden of testing, many schemes for designing the circuit for improved ... Read more
In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance ments in this area pose many new problems in the area of testing. Testing has become a very time-consuming process. In order to ease the burden of testing, many schemes for designing the circuit for improved ... Read more
Product Details
Format
Paperback
Publication date
2011
Publisher
Springer-Verlag New York Inc. United States
Number of pages
232
Condition
New
Series
The Springer International Series in Engineering and Computer Science
Number of Pages
232
Place of Publication
New York, NY, United States
ISBN
9781461288183
SKU
V9781461288183
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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