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Fruett, Fabiano; Meijer, Gerard C. M. - The Piezojunction Effect In Silicon Inte - 9781441952820 - V9781441952820
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The Piezojunction Effect In Silicon Inte

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Description for The Piezojunction Effect In Silicon Inte Paperback. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 162 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 9. Weight in Grams: 278.
Mechanical stress affects the magnitude of base-emitter voltages of forward biased bipolar transistors. This phenomenon is called the piezojunction effect. The piezojunction effect is the main cause of inaccuracy and drift in integrated temperature sensors and bandgap voltage references. The aim of The Piezojunction Effect in Silicon Integrated Circuits and Sensors is twofold. Firstly, to describe techniques that can reduce the mechanical-stress-induced inaccuracy and long-term instability. Secondly, to show, that the piezojunction effect can be applied for new types of mechanical-sensor structures. During IC fabrication and packaging thermo-mechanical stress is ... Read more

Product Details

Format
Paperback
Publication date
2010
Publisher
Springer-Verlag New York Inc. United States
Number of pages
162
Condition
New
Series
The Springer International Series in Engineering and Computer Science
Number of Pages
162
Place of Publication
New York, NY, United States
ISBN
9781441952820
SKU
V9781441952820
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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